School of Engineering (SoE), G D Goenka University organized an industrial visit to Associated Electronics Research Foundation (AERF), Research & Development Centre at Noida on 5th Feb, 2014 for 1st year students of B.Tech ECE (Electronics and Communication Engineering).
A total of 30 students visited the Centre between 12:30 pm to 2:30 pm. The overall objective of the visit was to give students a practical exposure to different testing facilities available in AERF. The Testing and Calibration laboratories of AERF are recognized by the Government of India through NABL, (National Accreditation Board for Testing and Calibration Laboratories), Department of Science and Technology, for Testing and Calibration of Electrical and Electronic items.
Students were divided into two groups. Each group was taken separately and explained functioning of various products developed by the experts from AERF. Products developed recently like Voice over IP chip (VOIP), Audio Plus, Field Telephone Set were demonstrated and explained to the students.
Equipments like Beam Scanning Testing Jig, Coating Thickness Tester, Hardness Tester, Bursting Tester, FBT Tester, Switch Life Testing Jig, Tensile Strength Tester, and Vibration Tester were demonstrated and explained practically to the students. Students were then made conversant with equipment like Environmental Chamber, Humidity Chamber, Salt Spray Chamber, and Dry Heat Chamber. Students also visited the Calibration Lab, Computer Aided Design Lab, and PCB Designing Lab. In addition to this, facilities available at AERF like Milling Machine, Surface Grinder, Hand Press, Shearing Machine and Drilling Machines were shown to the students.
This educational trip was very informative and gave the students a feel of the R & D work being carried out in the field of embedded system, communication, and VLSI. Faculty members Mr. Mandeep Singh Narula (Assistant Professor, SoE) and Ms. Leesha Aneja (Assistant Professor, SoE) coordinated the visit. The students enjoyed the trip immensely.
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